This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. The 44 papers presented were carefully reviewed and selected from 162 submissions. The papers discuss the frontiers of design and test of VLSI components, circuits and systems. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings Singh Manoj Gaur, Mark ... and Gaurav Trivedi1 1 Department of Electronics and Electrical Engineering Indian Institute of Technology Guwahati, India ... We describe a new method, Kapees, for large scale standard cell placement.
|Title||:||VLSI Design and Test|
|Author||:||Singh Manoj Gaur, Mark Zwolinski, Vijay Laxmi, D. Boolchandani, Virendra Sing, Adit Singh|
|Publisher||:||Springer - 2013-12-13|