For simple devices, manual generation offers low cost in terms of equipment and time. Automatic test generation ... A test partem is a truth table that has two dimensions: one for device pins (41 In this example) and one for time flow (1 6 i In this example) during the test. Fig 1. Depending on ... In real-world test environments, test engineers often reduce their tests to meaningful subsets of aquot; testing everything.
|Title||:||Tutorial test generation for VLSI chips|
|Author||:||Vishwani D. Agrawal, Sharad C. Seth, IEEE Computer Society|
|Publisher||:||IEEE Computer Society - 1988|