This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.How does this method compare with the top-hat filter approach used in XEDS? Why do we recommend using ... Compare and contrast the two principal methods of deconvolution in Figures 39.17 and 39.18. Why cana#39;t we simply expand theanbsp;...
|Title||:||Transmission Electron Microscopy|
|Author||:||David B. Williams, C. Barry Carter|
|Publisher||:||Springer Science & Business Media - 2009-07-31|