Microscopy of Semiconducting Materials 2007

Microscopy of Semiconducting Materials 2007

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This volume contains invited and contributed papers presented at the conference on a€˜Microscopy of Semiconducting Materialsa€™ held at the University of Cambridge on 2-5 April 2007. The event was organised under the auspices of the Electron Microscopy and Analysis Group of the Institute of Physics, the Royal Microscopical Society and the Materials Research Society. This international conference was the fifteenth in the series that focuses on the most recent world-wide advances in semiconductor studies carried out by all forms of microscopy and it attracted delegates from more than 20 countries. With the relentless evolution of advanced electronic devices into ever smaller nanoscale structures, the problem relating to the means by which device features can be visualised on this scale becomes more acute. This applies not only to the imaging of the general form of layers that may be present but also to the determination of composition and doping variations that are employed. In view of this scenario, the vital importance of transmission and scanning electron microscopy, together with X-ray and scanning probe approaches can immediately be seen. The conference featured developments in high resolution microscopy and nanoanalysis, including the exploitation of recently introduced aberration-corrected electron microscopes. All associated imaging and analytical techniques were demonstrated in studies including those of self-organised and quantum domain structures. Many analytical techniques based upon scanning probe microscopies were also much in evidence, together with more general applications of X-ray diffraction methods.... Sheffield S1 3JD, UK Summary: Energy-dispersive X-ray spectroscopy is a standard tool for microanalysis in transmission electron microscopy. ... depths within a GaAs thin foil specimen by modelling electron scattering and X-ray generation using Monte Carlo simulations. ... code CASINO (version 2.4.2) introduced in [3], with default settings as described in the user manual, using tabulated values ofanbsp;...

Title:Microscopy of Semiconducting Materials 2007
Author:A.G. Cullis, P.A. Midgley
Publisher:Springer Science & Business Media - 2008-12-02


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