This methodology is effective in characterizing variability. It improves the accuracy of statistical models and allows process corners to be set up for WID or D2D variations. In addition, sources of systematic variations are identified and the impact of layout design rules are measured. As scaling continues and variation increases, characterization of variability will become an integral part of the IC design process.... C. l DG2020A data generator from Tektronix 127 C.2 Keithley 2400 source meter 128 C.3 Infiniium 54855A DSO 20GSPS oscilloscope from Agilent 128 C.4 TLA5202 logic analyzer from Tektronix 129 C.5 GPIB-ENET/100 box from Nationalanbsp;...
|Title||:||Measurement and Analysis of Variability in CMOS Circuits|
|Author||:||Liang Teck Pang|
|Publisher||:||ProQuest - 2008|