Crystallographic texture or preferred orientation has long been known to strongly influence material properties. Historically, the means of obtaining such texture data has been though the use of x-ray or neutron diffraction for bulk texture measurements, or transmission electron microscopy (TEM) or electron channeling for local crystallographic information. In recent years, we have seen the emergence of a new characterization technique for probing the microtexture of materials. This advance has come about primarily through the automated indexing of electron backscatter diffraction (EBSD) patterns.Crystallographic texture or preferred orientation has long been known to strongly influence material properties.
|Title||:||Electron Backscatter Diffraction in Materials Science|
|Author||:||Adam J. Schwartz, Mukul Kumar, Brent L. Adams|
|Publisher||:||Springer Science & Business Media - 2000-01-01|