Defects in electronic materials II

Defects in electronic materials II

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.The PL produced by pulsed excitation was measured using a digital oscilloscope (Tektronix TDS 684A). ... For the EPR study, a Broker ESP-300 spectrometer, operating at a microwave frequency of 9.45 GHz, a static-field modulation frequency of ... 90J(__^ (X1O0) V- (c) 1 I Material Defect sAr Al1 Reference ZnS VS 2.0034 .

Title:Defects in electronic materials II
Author:Jürgen Michel
Publisher: - 1997-05-02


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