.q.. ALTECH 2003 was Symposium J1 held at the 203rd Meeting of the Electrochemical Society in Paris, France from April 27 to May 2, 2003 ... Symposium M1, Diagnostic Techniques for Semiconductor Materials and Devices, was part of the 202nd Meeting of the Electrochemical Society held in Salt Lake City, Utah, from October 21 to 25, 2002 ...q--p. iii.Apparatus SPME A manual SPME holder was used with a 75 \im coating thickness PDMS/Carboxen fibre with 1 cm length ... Humidity monitored Chromatography A Varian 3400 gas chromatograph coupled to a Varian Saturn II Ion Trap massanbsp;...
|Title||:||Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes|
|Author||:||Bernd O. Kolbesen|
|Publisher||:||The Electrochemical Society - 2003|